Tadahiro Kuroda and Atsutake Kosuge,
“VLSI Design and Test for Systems Dependability (Chapter21: Wireless Interconnect in Electronic Systems),”
ISBN 978-4-431-56592-5, Springer, 2019.
Tadahiro Kuroda and Atsutake Kosuge,
“VLSI Design and Test for Systems Dependability (Chapter8: Connectivity in Electronic Packaging) ,”
ISBN 978-4-431-56592-5, Springer, 2019.